Dissemination of IT for the Promotion of Materials Science (DoITPoMS)

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Categories > Metal or alloy > Bi 60, Sn 40 (wt%) > Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode

3 micrographs available, ordered by micrograph number.

Link to full record for micrograph 759 Micrograph 759 : Bi 60, Sn 40 (wt%)
System: Bi-Sn, Composition: Bi 60, Sn 40 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
300 μm
Link to full record for micrograph 760 Micrograph 760 : Bi 60, Sn 40 (wt%)
System: Bi-Sn, Composition: Bi 60, Sn 40 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
100 μm
Link to full record for micrograph 761 Micrograph 761 : Bi 60, Sn 40 (wt%)
System: Bi-Sn, Composition: Bi 60, Sn 40 (wt%)
Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
10 μm

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