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Categories > Metal or alloy > Bi-Sn > Bi 70, Sn 30 (wt%) > Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode > Keyword: tin
3 micrographs available, ordered by micrograph number.
Micrograph
762
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Bi 70, Sn 30 (wt%) System: Bi-Sn, Composition: Bi 70, Sn 30 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 300 μm |
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Micrograph
763
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Bi 70, Sn 30 (wt%) System: Bi-Sn, Composition: Bi 70, Sn 30 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 100 μm |
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Micrograph
764
:
Bi 70, Sn 30 (wt%) System: Bi-Sn, Composition: Bi 70, Sn 30 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 10 μm |
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