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Categories > Metal or alloy > Ni-X
6 techniques available. The number of micrographs available is given in [brackets].
- Field emission gun scanning electron microscopy (FEGSEM) in secondary electron imaging (SEI) mode [3]
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- Reflected light microscopy, cross-polarised, with Nomarski filter [8]
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- Scanning electron microscopy (SEM) [3]
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- Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode [5]
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- Transmission electron microscopy (TEM) [1]
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- Transmission electron microscopy (TEM) of carbon replica [1]
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