Micrograph Library
Browse the libraryAdvanced searchSystemsCompositionsTechniquesKeywordsPhase diagramsHelpPreferencesAbout the micrograph libraryTerms of useContribute micrographs!FeedbackLinksCredits Print this page
Browse the Library
Categories > Metal or alloy > Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode > Keyword: extrusion
2 micrographs available, ordered by micrograph number.
 |
Micrograph
724
:
Ni-Superalloy, as-extruded microstructure System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy) Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode 10 μm |
 |
Micrograph
725
:
Ni-Superalloy, as-extruded microstructure System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy) Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode 10 μm |
Help is available on browsing.
Alternatively, search the Library (from top right on any page), or use advanced search.