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Categories > Metal or alloy > Scanning electron microscopy (SEM) > Keyword: aluminium

11 micrographs available, ordered by micrograph number.

Showing 1 - 10 of 11 micrographs Page 1 2 | Previous | Next
Link to full record for micrograph 2 Micrograph 2 : Al 75, Cu 25 (wt%), hypoeutectic alloy
System: Al-Cu, Composition: Al 75, Cu 25 (wt%)
Scanning electron microscopy (SEM)
30 μm
Link to full record for micrograph 4 Micrograph 4 : Al 67, Cu 33 (wt%), eutectic alloy
System: Al-Cu, Composition: Al 67, Cu 33 (wt%)
Scanning electron microscopy (SEM)
15 μm
Link to full record for micrograph 82 Micrograph 82 : Aluminium, fracture surface
System: Al, Composition: Not specified
Scanning electron microscopy (SEM)
15 μm
Link to full record for micrograph 83 Micrograph 83 : Aluminium, fracture surface
System: Al, Composition: Not specified
Scanning electron microscopy (SEM)
50 μm
Link to full record for micrograph 137 Micrograph 137 : Al-Mg-Si, failed through microvoid coalescence.
System: Al-Mg-Si, Composition: Al, Si 1.2, Mg 0.4 (wt%) (AA6016)
Scanning electron microscopy (SEM)
40 μm
Link to full record for micrograph 138 Micrograph 138 : Al-Mg-Si, failed through microvoid coalescence.
System: Al-Mg-Si, Composition: Al, Si 1.2, Mg 0.4 (wt%) (AA6016)
Scanning electron microscopy (SEM)
40 μm
Link to full record for micrograph 139 Micrograph 139 : Al-Mg-Si, failed through microvoid coalescence.
System: Al-Mg-Si, Composition: Al, Si 1.2, Mg 0.4 (wt%) (AA6016)
Scanning electron microscopy (SEM)
40 μm
Link to full record for micrograph 140 Micrograph 140 : Al-Mg-Si, failed through microvoid coalescence.
System: Al-Mg-Si, Composition: Al, Si 1.2, Mg 0.4 (wt%) (AA6016)
Scanning electron microscopy (SEM)
40 μm
Link to full record for micrograph 141 Micrograph 141 : Al-Mg-Si, failed through microvoid coalescence.
System: Al-Mg-Si, Composition: Al, Si 1.2, Mg 0.4 (wt%) (AA6016)
Scanning electron microscopy (SEM)
40 μm
Link to full record for micrograph 142 Micrograph 142 : Tough pitch copper, failed by fibrous ductile fracture.
System: Cu, Composition: Tough pitch copper
Scanning electron microscopy (SEM)
20 μm
Showing 1 - 10 of 11 micrographs Page 1 2 | Previous | Next

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