Dissemination of IT for the Promotion of Materials Science (DoITPoMS)

DoITPoMS Micrograph Library Browse the Library
Micrograph Library Browse the libraryAdvanced searchSystemsCompositionsTechniquesKeywordsPhase diagrams
HelpPreferencesAbout the micrograph libraryTerms of useContribute micrographs!FeedbackLinksCredits Print this page
micrograph index montage

Browse the Library

Categories > Metal or alloy > Field emission gun scanning electron microscopy (FEGSEM) in secondary electron imaging (SEI) mode

3 micrographs available, ordered by micrograph number.

Link to full record for micrograph 721 Micrograph 721 : Ni-Superalloy
System: Ni-X, Composition: Ni, Al, Re, W, Ta, Cr, Co, Ru (Ni-Superalloy)
Field emission gun scanning electron microscopy (FEGSEM) in secondary electron imaging (SEI) mode
10 μm
Link to full record for micrograph 722 Micrograph 722 : Ni-Superalloy
System: Ni-X, Composition: Ni, Al, Re, W, Ta, Cr, Co, Ru (Ni-Superalloy)
Field emission gun scanning electron microscopy (FEGSEM) in secondary electron imaging (SEI) mode
6 μm
Link to full record for micrograph 727 Micrograph 727 : Ni-Superalloy, heat treated above gamma-prime solvus
System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy)
Field emission gun scanning electron microscopy (FEGSEM) in secondary electron imaging (SEI) mode
100 nm

Help is available on browsing.

Alternatively, search the Library (from top right on any page), or use advanced search.