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Categories > Metal or alloy > Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode
27 micrographs available, ordered by micrograph number.
| Showing 21 - 27 of 27 micrographs | Page 1 2 3 | Previous | Next |
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Micrograph
764
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Bi 70, Sn 30 (wt%) System: Bi-Sn, Composition: Bi 70, Sn 30 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 10 μm |
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Micrograph
765
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Bi 80, Sn 20 (wt%) System: Bi-Sn, Composition: Bi 80, Sn 20 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 300 μm |
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Micrograph
766
:
Bi 80, Sn 20 (wt%) System: Bi-Sn, Composition: Bi 80, Sn 20 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 100 μm |
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Micrograph
767
:
Bi 80, Sn 20 (wt%) System: Bi-Sn, Composition: Bi 80, Sn 20 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 10 μm |
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Micrograph
768
:
Bi 90, Sn 10 (wt%) System: Bi-Sn, Composition: Bi 90, Sn 10 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 300 μm |
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Micrograph
769
:
Bi 90, Sn 10 (wt%) System: Bi-Sn, Composition: Bi 90, Sn 10 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 100 μm |
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Micrograph
770
:
Bi 90, Sn 10 (wt%) System: Bi-Sn, Composition: Bi 90, Sn 10 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 10 μm |
| Showing 21 - 27 of 27 micrographs | Page 1 2 3 | Previous | Next |
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