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Categories > Ceramic > Keyword: silicon carbide
11 micrographs available, ordered by micrograph number.
Showing 1 - 10 of 11 micrographs | Page 1 2 | Previous | Next |
Micrograph
185
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Silicon Nitride-bonded Silicon Carbide System: Silicon nitride-bonded silicon carbide, Composition: Particles of SiC in a reaction-bonded Si3N4 matrix Reflected light microscopy 250 μm |
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Micrograph
186
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Silicon Carbide from within a Silicon Nitride-bonded Silicon Carbide sample System: Silicon nitride-bonded silicon carbide, Composition: Particles of SiC in a reaction-bonded Si3N4 matrix Reflected light microscopy 25 μm |
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Micrograph
546
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Delamination cracks seen in h-BN particles subjected to compressive stress in the (0001) planes (within a silicon nitride particulate-reinforced silicon carbide composite) System: Si3N4-SiC composite, Composition: Not specified High resolution electron microscopy (HREM) 10 nm |
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Micrograph
547
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h-BN inclusion (precipitate) in a b-Si3N4 grain (within a silicon nitride particulate-reinforced silicon carbide composite) System: Si3N4-SiC composite, Composition: Not specified High resolution electron microscopy (HREM) 20 nm |
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Micrograph
549
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Misoriented interphase boundary between h-BN (precipitate) and SiC grains (within a silicon nitride particulate-reinforced silicon carbide composite) System: Si3N4-SiC composite, Composition: Not specified High resolution electron microscopy (HREM) 1.2 nm |
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Micrograph
551
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A regularly stepped interface boundary between h-BN (precipitate) and Si3N4 grains (within a silicon nitride particulate-reinforced silicon carbide composite) System: Si3N4-SiC composite, Composition: Not specified High resolution electron microscopy (HREM) 10 nm |
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Micrograph
552
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An amorphous phase trapped at a triple junction between Si3N4 grains (within a silicon nitride particulate-reinforced silicon carbide composite). System: Si3N4-SiC composite, Composition: Not specified High resolution electron microscopy (HREM) 20 nm |
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Micrograph
553
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Image of part of a crystalline triple junction between SiC grains (within a silicon nitride particulate-reinforced silicon carbide composite) System: Si3N4-SiC composite, Composition: Not specified High resolution electron microscopy (HREM) 6 nm |
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Micrograph
554
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Silicon carbide System: SiC, Composition: Not specified Photography (no microscope) 10 mm |
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Micrograph
691
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Silicon carbide System: SiC, Composition: Not specified Reflected light microscopy 100 μm |
Showing 1 - 10 of 11 micrographs | Page 1 2 | Previous | Next |
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