Dissemination of IT for the Promotion of Materials Science (DoITPoMS)

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Categories > Ceramic

92 micrographs available, ordered by micrograph number.

Showing 81 - 90 of 92 micrographs Page 1 .. 4 5 6 7 8 9 10 | Previous | Next
Link to full record for micrograph 692 Micrograph 692 : Silicon carbide
System: SiC, Composition: Not specified
Reflected light microscopy
50 μm
Link to full record for micrograph 693 Micrograph 693 : ZTS, dielectric ceramic
System: ZTS, Composition: Not specified
Reflected light microscopy
400 μm
Link to full record for micrograph 694 Micrograph 694 : ZTS, dielectric ceramic
System: ZTS, Composition: Not specified
Reflected light microscopy
200 μm
Link to full record for micrograph 847 Micrograph 847 : Plasma sprayed (PS) partially stabilised zirconia (PSZ) showing splat morphology
System: ZrO2-Yb2O3, Composition: ZrO2 84, Yb2O3 16 (wt%)
Field emission gun scanning electron microscopy (FEGSEM)
2 μm
Link to full record for micrograph 848 Micrograph 848 : Physical vapour deposited (PVD) partially stabilized zirconia (PSZ) showing columnar structure
System: ZrO2-Y2O3, Composition: ZrO2 92.5, Y2O3 7.5 (wt%)
Field emission gun scanning electron microscopy (FEGSEM)
1 μm
Link to full record for micrograph 849 Micrograph 849 : Partially stabilized zirconia (PSZ) powder for plasma spraying
System: ZrO2-Y2O3, Composition: ZrO2 92.5, Y2O3 7.5 (wt%)
Scanning electron microscopy (SEM)
100 μm
Link to full record for micrograph 861 Micrograph 861 : Carbon
System: C, Composition: Carbon
Atomic force microscopy (AFM)
2 μm
Link to full record for micrograph 862 Micrograph 862 : Carbon
System: C, Composition: Carbon
Atomic force microscopy (AFM)
1 μm
Link to full record for micrograph 863 Micrograph 863 : Carbon
System: C, Composition: Carbon
Atomic force microscopy (AFM)
100 nm
Link to full record for micrograph 868 Micrograph 868 : Diamond
System: C, Composition: Carbon
Atomic force microscopy (AFM)
10 μm
Showing 81 - 90 of 92 micrographs Page 1 .. 4 5 6 7 8 9 10 | Previous | Next

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