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Categories > Composite > Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode > Keyword: composite material
2 micrographs available, ordered by micrograph number.
Micrograph
195
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Zirconia Toughened Alumina (ZTA) System: ZrO2-Al2O3, Composition: ZrO2 5-30, Al2O3 70-95 (wt%) Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode 10 μm |
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Micrograph
624
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Inter-particle bond in the fire-resistant composite Barrikade (R) System: Barrikade, Composition: Expanded vermiculite, cured in ZnO and mixed with binder Scanning electron microscopy (SEM) in backscattered electron imaging (BEI) mode 100 μm |
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