Keyword
5 micrographs for keyword device, ordered by micrograph number.
Micrograph
124
:
CMOS integrated circuit with Al wiring System: Miscellaneous, Composition: Not specified Focused ion beam (FIB) secondary electron image 20 μm |
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Micrograph
125
:
CMOS integrated circuit with Al wiring System: Miscellaneous, Composition: Not specified Focused ion beam (FIB) secondary electron image 2 μm |
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Micrograph
126
:
CMOS integrated circuit with Al wiring System: Miscellaneous, Composition: Not specified Focused ion beam (FIB) secondary electron image 15 μm |
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Micrograph
127
:
CMOS integrated circuit with Al wiring System: Miscellaneous, Composition: Not specified Focused ion beam (FIB) secondary electron image 40 μm |
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Micrograph
128
:
CMOS integrated circuit with Al wiring System: Miscellaneous, Composition: Not specified Focused ion beam (FIB) secondary electron image 4 μm |