Keyword
86 micrographs for keyword tin, ordered by micrograph number.
Showing 61 - 70 of 86 micrographs | Page 1 .. 3 4 5 6 7 8 9 | Previous | Next |
Micrograph
745
:
Bi 10, Sn 90 (wt%) System: Bi-Sn, Composition: Bi 10, Sn 90 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 100 μm |
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Micrograph
746
:
Bi 10, Sn 90 (wt%) System: Bi-Sn, Composition: Bi 10, Sn 90 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 10 μm |
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Micrograph
747
:
Bi 20, Sn 80 (wt%) System: Bi-Sn, Composition: Bi 20, Sn 80 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 300 μm |
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Micrograph
748
:
Bi 20, Sn 80 (wt%) System: Bi-Sn, Composition: Bi 20, Sn 80 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 100 μm |
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Micrograph
749
:
Bi 20, Sn 80 (wt%) System: Bi-Sn, Composition: Bi 20, Sn 80 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 10 μm |
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Micrograph
750
:
Bi 30, Sn 70 (wt%) System: Bi-Sn, Composition: Bi 30, Sn 70 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 300 μm |
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Micrograph
751
:
Bi 30, Sn 70 (wt%) System: Bi-Sn, Composition: Bi 30, Sn 70 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 100 μm |
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Micrograph
752
:
Bi 30, Sn 70 (wt%) System: Bi-Sn, Composition: Bi 30, Sn 70 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 10 μm |
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Micrograph
753
:
Bi 40, Sn 60 (wt%) System: Bi-Sn, Composition: Bi 40, Sn 60 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 300 μm |
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Micrograph
754
:
Bi 40, Sn 60 (wt%) System: Bi-Sn, Composition: Bi 40, Sn 60 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 100 μm |
Showing 61 - 70 of 86 micrographs | Page 1 .. 3 4 5 6 7 8 9 | Previous | Next |