System
30 micrographs for system Bi-Sn, ordered by micrograph number.
Showing 21 - 30 of 30 micrographs | Page 1 2 3 | Previous | Next |
Micrograph
764
:
Bi 70, Sn 30 (wt%) System: Bi-Sn, Composition: Bi 70, Sn 30 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 10 μm |
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Micrograph
765
:
Bi 80, Sn 20 (wt%) System: Bi-Sn, Composition: Bi 80, Sn 20 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 300 μm |
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Micrograph
766
:
Bi 80, Sn 20 (wt%) System: Bi-Sn, Composition: Bi 80, Sn 20 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 100 μm |
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Micrograph
767
:
Bi 80, Sn 20 (wt%) System: Bi-Sn, Composition: Bi 80, Sn 20 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 10 μm |
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Micrograph
768
:
Bi 90, Sn 10 (wt%) System: Bi-Sn, Composition: Bi 90, Sn 10 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 300 μm |
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Micrograph
769
:
Bi 90, Sn 10 (wt%) System: Bi-Sn, Composition: Bi 90, Sn 10 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 100 μm |
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Micrograph
770
:
Bi 90, Sn 10 (wt%) System: Bi-Sn, Composition: Bi 90, Sn 10 (wt%) Scanning electron microscopy (SEM) in secondary electron imaging (SEI) mode 10 μm |
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Micrograph
858
:
Bi 40wt%, Sn 60wt% System: Bi-Sn, Composition: Bi 40, Sn 60 (wt%) Reflected light microscopy 100 μm |
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Micrograph
859
:
Bi 60wt%, Sn 40wt% System: Bi-Sn, Composition: Bi 60, Sn 40 (wt%) Reflected light microscopy 100 μm |
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Micrograph
860
:
Bi 80wt%, Sn 20wt% System: Bi-Sn, Composition: Bi 80, Sn 20 (wt%) Reflected light microscopy 100 μm |
Showing 21 - 30 of 30 micrographs | Page 1 2 3 | Previous | Next |