Dissemination of IT for the Promotion of Materials Science (DoITPoMS)

DoITPoMS Micrograph Library Technique
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Technique

3 micrographs for technique Field emission gun scanning electron microscopy (FEGSEM) in secondary electron imaging (SEI) mode, ordered by micrograph number.

Link to full record for micrograph 721 Micrograph 721 : Ni-Superalloy
System: Ni-X, Composition: Ni, Al, Re, W, Ta, Cr, Co, Ru (Ni-Superalloy)
Field emission gun scanning electron microscopy (FEGSEM) in secondary electron imaging (SEI) mode
10 μm
Link to full record for micrograph 722 Micrograph 722 : Ni-Superalloy
System: Ni-X, Composition: Ni, Al, Re, W, Ta, Cr, Co, Ru (Ni-Superalloy)
Field emission gun scanning electron microscopy (FEGSEM) in secondary electron imaging (SEI) mode
6 μm
Link to full record for micrograph 727 Micrograph 727 : Ni-Superalloy, heat treated above gamma-prime solvus
System: Ni-X, Composition: Ni, Cr 14.4-15.2, Co 13-18, Mo 3.5-4.5, Al 3.0-3.3, Ti 4.2-4.8, Ta 2.5, Zr 0.05-0.07, C 0.05, B 0.01-0.03 (wt%) (Ni-Superalloy)
Field emission gun scanning electron microscopy (FEGSEM) in secondary electron imaging (SEI) mode
100 nm

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